Zaunert F, Endres R, Stefanov Y, Schwalke U. Evaluation of MOSFETs with crystalline high-k gate-dielectrics: device simulation and experimental data. JTIT [Internet]. 2007 Jun. 30 [cited 2026 Jun. 19];28(2):78-85. Available from: https://www.jtit.pl/jtit/article/view/812