ALI, Khaled Ben; NEVE, César Roda; RASKIN, Jean-Pierre. Impact of Crosstalk into High Resistivity Silicon Substrate on the RF Performance of SOI MOSFET. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 42, n. 4, p. 93–100, 2010. DOI: 10.26636/jtit.2010.4.1101. Disponível em: https://www.jtit.pl/jtit/article/view/1101. Acesso em: 5 jul. 2026.