Monte Carlo method used for a prognosis of selected technological parameters

Authors

  • Małgorzata Langer

DOI:

https://doi.org/10.26636/jtit.2007.3.838

Keywords:

DFSS, MC method, PVD, contacts, Excel randomizing

Abstract

In this paper a smart modeling approach for realistic simulation of selected technological parameters is presented. The technology of making contacts with plasma vapor deposition (PVD) method has been chosen for this purpose. The analysis is based on the Monte Carlo (MC) method and uses the Excel worksheet – the simplest tool, easily accessible to anyone. The statistic parameters are calculated and discussed as we introduce this experiment to demonstrate the advantages of design for six sigma (DFSS)

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Published

2007-09-30

Issue

No. 3 (2007)

Section

ARTICLES FROM THIS ISSUE

License

Copyright (c) 2023 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
M. Langer, “ Monte Carlo method used for a prognosis of selected technological parameters”, JTIT, vol. 29, no. 3, pp. 96–100, Sep. 2007, doi: 10.26636/jtit.2007.3.838.