Janik T, Jakubowski A, Majkusiak B, Korwin-Pawłowski M. Comparison of gate leakage current components in metal-insulator-semiconductor structures with high-k gate dielectrics. JTIT [Internet]. 2001 Mar. 30 [cited 2026 Oct. 28];3(1):65-9. Available from: https://www.jtit.pl/jtit/article/view/38