Barańsk M, Sapor M, Niemiec H, Marczewski J, Kucharski K, Kucewicz W, et al. TSSOI as an efficient tool for diagnostics of SOI technology in Institute of Electron Technology. JTIT [Internet]. 2005 Mar. 30 [cited 2026 Jun. 15];19(1):85-93. Available from: https://www.jtit.pl/jtit/article/view/287