Głuszko, Grzegorz, Sławomir Szostak, Heinrich Gottlob, Max Lemme, and Lidia Łukasiak. “Characterization of SOI MOSFETs by Means of Charge-Pumping”. Journal of Telecommunications and Information Technology 29, no. 3 (September 30, 2007): 67–72. Accessed May 23, 2026. https://www.jtit.pl/jtit/article/view/832.