Ganum, Adriana, Dayang NurFatimah Awang Iskandar, Lim Phei Chi, and Ahmad Hadinata Fauzi. “Detection of Monocrystalline Silicon Wafer Defects Using Deep Transfer Learning”. Journal of Telecommunications and Information Technology 87, no. 1 (March 30, 2022): 34–42. Accessed May 22, 2026. https://www.jtit.pl/jtit/article/view/431.