[1]
D. Tomaszewski, C.-M. Yang, B. Jaroszewicz, M. Zaborowski, P. Grabiec, and D. G. Pijanowska, “Electrical characterization of ISFETs”, JTIT, vol. 29, no. 3, pp. 55–60, Sep. 2007, doi: 10.26636/jtit.2007.3.830.