J. Katcki, J. Ratajczak, A. Jakubowski, L. Łukasiak, D. Tomaszewski, and J. Gibki, “Characterization of SOI fabrication process using gated-diode measurements and TEM studies”, JTIT, vol. 2, no. 3-4, pp. 81–83, Dec. 2000, doi: 10.26636/jtit.2000.3-4.24.