[1]
J. Østhaug, T. A. Fjeldly, and B. Iniguez, “Closed-form 2D modeling of sub-100 nm MOSFETs in the subthreshold regime”, JTIT, vol. 15, no. 1, pp. 70–79, Mar. 2004, doi: 10.26636/jtit.2004.1.227.