GŁUSZKO, Grzegorz; SZOSTAK, Sławomir; GOTTLOB, Heinrich; LEMME, Max; ŁUKASIAK, Lidia. Characterization of SOI MOSFETs by means of charge-pumping. Journal of Telecommunications and Information Technology, [S. l.], v. 29, n. 3, p. 67–72, 2007. DOI: 10.26636/jtit.2007.3.832. Disponível em: https://www.jtit.pl/jtit/article/view/832. Acesso em: 23 may. 2026.