GRASSER, Tibor; SELBERHERR, Siegfried. Modeling of negative bias temperature instability. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 28, n. 2, p. 92–102, 2007. DOI: 10.26636/jtit.2007.2.814. Disponível em: https://www.jtit.pl/jtit/article/view/814. Acesso em: 13 jun. 2026.