M. THOMAS, Stephen; J. PREST, Marti; J. F. FULGONI, Dominic; R. BACON, Adam; J. GRASBY, Tim; R. LEADLEY, David; H. C. PARKER, Evan; E. WHALL, Terence. Low frequency noise in Si and Si/SiGe/Si PMOSFETs. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 28, n. 2, p. 64–68, 2007. DOI: 10.26636/jtit.2007.2.810. Disponível em: https://www.jtit.pl/jtit/article/view/810. Acesso em: 13 jun. 2026.