BALESTRA, Francis. Reliability of deep submicron MOSFETs. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 3, n. 1, p. 12–17, 2001. DOI: 10.26636/jtit.2001.1.48. Disponível em: https://www.jtit.pl/jtit/article/view/48. Acesso em: 3 aug. 2026.