BARAŃSK, Mateusz et al. TSSOI as an efficient tool for diagnostics of SOI technology in Institute of Electron Technology. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 19, n. 1, p. 85–93, 2005. DOI: 10.26636/jtit.2005.1.287. Disponível em: https://www.jtit.pl/jtit/article/view/287. Acesso em: 15 jun. 2026.