TOMASZEWSKI, Daniel. A versatile tool for extraction of MOSFETs parameters. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 19, n. 1, p. 129–134, 2005. DOI: 10.26636/jtit.2005.1.279. Disponível em: https://www.jtit.pl/jtit/article/view/279. Acesso em: 9 jul. 2026.