PALANKOVSKI, Vassil; SELBERHERR, Siegfried. Critical modeling issues of SiGe semiconductor devices. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 15, n. 1, p. 15–25, 2004. DOI: 10.26636/jtit.2004.1.233. Disponível em: https://www.jtit.pl/jtit/article/view/233. Acesso em: 17 jun. 2026.